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Автор: Muthukumaran Malarvel (Editor), Soumya Ranjan Nayak (Editor), Prasant Kumar Pattnaik (Editor)
Издательство: Wiley
Год: 2021
Формат: True PDF
Страниц: 337
Размер: 28.4 Mb
Язык: English
Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process.