Название: Thermal-Aware Testing of Digital VLSI Circuits and Systems
Автор: Santanu Chattopadhyay
Издательство: CRC Press
Год: 2018
Страниц: 138
Формат: True PDF
Размер: 10 Mb
Язык: English

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

Table of Contents
Chapter 1: VLSI Testing: An Introduction
Chapter 2: Circuit-Level Testing
Chapter 3: Test-Data Compression
Chapter 4: System-on-Chip Testing
Chapter 5: Network-on-Chip Testing